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Please note that the English version of this text has been prepared with the assistance of AI, and in some instances, it may not have been subsequently reviewed or edited by the authors.
Description
The project develops and validates a chemical, non-mechanical cleaning process to obtain imaging-grade, epitaxy-ready GaAs for small (<1 inch) photocathode wafers used in infrared and night vision equipment.
The Achievable Results
An in-situ spectroscopic ellipsometry method will be created and developed, supported by atomic force microscopy and X-ray photoelectron spectroscopy measurements, with regard to the control process and its parameter boundary values.
The Anticipated Benefit
The project will result in the creation of a cleaning and drying process, as well as initial design for future industrial equipment.
The Allocated Funding
160,000 EUR on 03/01/2026.






















